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Keysight 3070 Programming Services |
Genesys Industries
specializes in providing high quality turnkey solutions for all of your
test needs. We also offer a wide range of services to help you successfully
complete your objectives. Our services range from the following:
Basic
Test Program:
Our Basic
Test Program will provide all of the standard operations that are necessary
when creating a Test Program for the Keysight 3070. When you order the Basic Test
Program you will receive the following:
-
CAD translation
of your data to board and board_xy
-
Shorts and Opens
test
-
Analog discrete
component test
-
Standard digital
library tests (Keysight 3070 Library)
-
Setup libraries
for all non Keysight 3070 libraries
-
Set TestJet and
Polarity check options if needed
-
Setup Node libraries
for future analog functional considerations
-
Test generation
process
-
Preparation of required
fixture hardware materials
-
Program will list
all untestable devices
-
Test fixture installation
and debug
-
Board grading (100%
fault detection goal for testable Device pins)
-
Final documentation
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Library
Model Development:
A large number of
electrical devices are not in the standard Keysight Library. Genesys Industries
will develop a library model for your non Keysight library devices. Our goal
is to develop a library test which will exercise all testable device pins
for your specific circuit topology. In the cases where it is cost prohibitive
or not practical to develop a complete library model, Genesys will create
a device existence test. An existence test will verify that the correct
component is installed and oriented properly.
Summary of Genesys
Library Model Services:
-
Library Model Development
for non-library devices
-
Cluster Testing
(2 or more devices as 1 test)
-
Boundary Scan (generated
from manufacturer BSDL file)
-
Flash Programming
-
ISP Programming
-
EEPROM Programming
-
Custom Programmable
Device Development: PALs, ASICs, FPGAs
Programmable
device tests like PALs and FPGAs will be automatically generated from the
customer supplied PLD design files. Devices supported by Boundary Scan
will be developed using the manufacturer Boundary Scan Description Language
(BSDL) file. See the list of common programmable devices and their required
files below:
| Manufacturer |
Required Files |
| PALs, Gals, PLDs, |
.JED |
| Actel |
.EDN and .PIN |
| Altera |
.EDO |
| Cypress |
.RPT |
| Xilinx |
.ANN, .FIT, .EDN, .XNF |
| Vantis |
.VHO, .RPT, .JED |
| QuickLogic |
.EDO |
EEPROM and Flash Devices may be programmed
during the incircuit test. To provide this function the customer must supply
the Intel Hex file or a Motorola S-Record type file.
Cluster testing
is often incorporated when node access is limited, feedback loops exist
between 2 or more components, or when a specific design test requirement
needs to be met. Genesys Industries will work with you to develop and implement
the proper testing strategy concerning cluster testing.
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CAD
Translation to Board and Board_xy:
All printed circuit
boards designed today use some sort of CAM CAD software package. The output
files from these CAD packages provide a very fast and accurate method of
obtaining the information needed to build a 3070 test fixture and program. We will translate the associated CAD files into the required
3070 board and board_xy files. If CAD data is not available, a test fixture
may be developed by translating gerber files or by digitizing a blank PC
board.
CAD Translation
Services Summary:
-
CAD File Translation
-
Gerber File Translation
-
Digitize Blank PC
Board
For additional details
on CAD data requirements for Keysight test fixtures and programs, see the section
on CAD Information Definition.
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